Virtually-Aged Sampling DMR: Unifying Circuit Failure Prediction and Circuit Failure Detection

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Raghuraman Balasubramanian and Karthikeyan Sankaralingam. Virtually-Aged Sampling DMR: Unifying Circuit Failure Prediction and Circuit Failure Detection. In Proceedings of the 46th International Symposium on Microarchitectures (MICRO), 2013.

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Abstract

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BibTeX

 @inproceedings{micro2013:aged-sdmr,
   author={Raghuraman Balasubramanian and Karthikeyan Sankaralingam},
   title={Virtually-Aged Sampling DMR: Unifying Circuit Failure Prediction and Circuit Failure Detection},
   booktitle={Proceedings of the 46th International Symposium on Microarchitectures (MICRO)},
   year={2013},
   bib_dl_pdf = {http://www.cs.wisc.edu/vertical/papers/2013/micro13-agedsdmr.pdf},
   bib_dl_ppt = {http://www.cs.wisc.edu/vertical/talks/2013/micro13-agedsdmr.pptx},
   bib_pubtype = {Refereed Conference},
   bib_rescat = {proj-relax}
 }

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