Comprehensive Circuit Failure Prediction and Detection for Logic and SRAM using Virtual Aging, Sampled Redundancy, and Asymmetric Checkers

| Sorted by Date | Classified by Publication Type | Classified by Project |

Amir Yazdanbakhsh, Raghuraman Balasubramanian, Tony Nowatzki, and Karthikeyan Sankaralingam. Comprehensive Circuit Failure Prediction and Detection for Logic and SRAM using Virtual Aging, Sampled Redundancy, and Asymmetric Checkers. IEEE Micro, 2015.

Download

(unavailable)

Abstract

(unavailable)

BibTeX

 @article{ieeemicro15:sdmr,
   title={Comprehensive Circuit Failure Prediction and Detection for Logic and SRAM using Virtual Aging, Sampled Redundancy, and Asymmetric Checkers},
   author={Amir Yazdanbakhsh and Raghuraman Balasubramanian and Tony Nowatzki and Karthikeyan Sankaralingam},
   journal="{IEEE Micro}",
   year={2015},
   bib_pubtype = {Journal},
   bib_rescat = {proj-relax}
 }

Generated by bib.pl (written by Patrick Riley ) on Sun Sep 26, 2021 16:14:28 time=1207019082