» Measures of the Effectiveness of Fault Signature Analysis

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James E. Smith. Measures of the Effectiveness of Fault Signature Analysis. IEEE Trans. Computers, 29(6):510-514, 1980.

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BibTeX

 @article{DBLP:journals/tc/Smith80,
   author    = {James E. Smith},
   title     = {Measures of the Effectiveness of Fault Signature Analysis},
   journal   = {{IEEE} Trans. Computers},
   volume    = {29},
   number    = {6},
   pages     = {510--514},
   year      = {1980},
   url       = {https://doi.org/10.1109/TC.1980.1675610},
   doi       = {10.1109/TC.1980.1675610},
   timestamp = {Mon, 11 Sep 2017 01:00:00 +0200},
   biburl    = {https://dblp.org/rec/journals/tc/Smith80.bib},
   bibsource = {dblp computer science bibliography, https://dblp.org}
 }

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