» Comprehensive Circuit Failure Prediction for Logic and SRAM Using Virtual Aging

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Amir Yazdanbakhsh, Raghuraman Balasubramanian, Tony Nowatzki, and Karthikeyan Sankaralingam. Comprehensive Circuit Failure Prediction for Logic and SRAM Using Virtual Aging. IEEE Micro, 35(6):24-36, 2015.

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BibTeX

 @article{DBLP:journals/micro/YazdanbakhshBNS15,
   author    = {Amir Yazdanbakhsh and
                Raghuraman Balasubramanian and
                Tony Nowatzki and
                Karthikeyan Sankaralingam},
   title     = {Comprehensive Circuit Failure Prediction for Logic and {SRAM} Using
                Virtual Aging},
   journal   = {{IEEE} Micro},
   volume    = {35},
   number    = {6},
   pages     = {24--36},
   year      = {2015},
   url       = {https://doi.org/10.1109/MM.2015.136},
   doi       = {10.1109/MM.2015.136},
   timestamp = {Sat, 20 May 2017 01:00:00 +0200},
   biburl    = {https://dblp.org/rec/journals/micro/YazdanbakhshBNS15.bib},
   bibsource = {dblp computer science bibliography, https://dblp.org}
 }

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