UW Madison Computer Architecture |
» Exploring the Interaction Between Device Lifetime Reliability and Security Vulnerabilities |
| Sorted by Date | Classified by Faculty | Chen-Han Ho, Garret Staus, Aaron Ullmer, and Karu Sankaralingam. Exploring the Interaction Between Device Lifetime Reliability and Security Vulnerabilities. IEEE Comput. Archit. Lett., 10(2):37-40, 2011. Download(unavailable) Abstract(unavailable) BibTeX@article{DBLP:journals/cal/HoSUS11, author = {Chen{-}Han Ho and Garret Staus and Aaron Ullmer and Karu Sankaralingam}, title = {Exploring the Interaction Between Device Lifetime Reliability and Security Vulnerabilities}, journal = {{IEEE} Comput. Archit. Lett.}, volume = {10}, number = {2}, pages = {37--40}, year = {2011}, url = {https://doi.org/10.1109/L-CA.2011.16}, doi = {10.1109/L-CA.2011.16}, timestamp = {Sun, 15 Mar 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/cal/HoSUS11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} } Generated by bib.pl (written by Patrick Riley ) on Mon Sep 27, 2021 15:47:00 time=1207019082 |
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