» Exploring the Interaction Between Device Lifetime Reliability and Security Vulnerabilities

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Chen-Han Ho, Garret Staus, Aaron Ullmer, and Karu Sankaralingam. Exploring the Interaction Between Device Lifetime Reliability and Security Vulnerabilities. IEEE Comput. Archit. Lett., 10(2):37-40, 2011.

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BibTeX

 @article{DBLP:journals/cal/HoSUS11,
   author    = {Chen{-}Han Ho and
                Garret Staus and
                Aaron Ullmer and
                Karu Sankaralingam},
   title     = {Exploring the Interaction Between Device Lifetime Reliability and
                Security Vulnerabilities},
   journal   = {{IEEE} Comput. Archit. Lett.},
   volume    = {10},
   number    = {2},
   pages     = {37--40},
   year      = {2011},
   url       = {https://doi.org/10.1109/L-CA.2011.16},
   doi       = {10.1109/L-CA.2011.16},
   timestamp = {Sun, 15 Mar 2020 00:00:00 +0100},
   biburl    = {https://dblp.org/rec/journals/cal/HoSUS11.bib},
   bibsource = {dblp computer science bibliography, https://dblp.org}
 }

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