» Virtually-aged sampling DMR: unifying circuit failure prediction and circuit failure detection

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Raghuraman Balasubramanian and Karthikeyan Sankaralingam. Virtually-aged sampling DMR: unifying circuit failure prediction and circuit failure detection. In The 46th Annual IEEE/ACM International Symposium on Microarchitecture, MICRO-46, Davis, CA, USA, December 7-11, 2013, pp. 123-135, ACM, 2013.

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BibTeX

 @inproceedings{DBLP:conf/micro/BalasubramanianS13,
   author    = {Raghuraman Balasubramanian and
                Karthikeyan Sankaralingam},
   editor    = {Matthew K. Farrens and
                Christos Kozyrakis},
   title     = {Virtually-aged sampling {DMR:} unifying circuit failure prediction
                and circuit failure detection},
   booktitle = {The 46th Annual {IEEE/ACM} International Symposium on Microarchitecture,
                MICRO-46, Davis, CA, USA, December 7-11, 2013},
   pages     = {123--135},
   publisher = {{ACM}},
   year      = {2013},
   url       = {https://doi.org/10.1145/2540708.2540720},
   doi       = {10.1145/2540708.2540720},
   timestamp = {Wed, 11 Aug 2021 11:51:26 +0200},
   biburl    = {https://dblp.org/rec/conf/micro/BalasubramanianS13.bib},
   bibsource = {dblp computer science bibliography, https://dblp.org}
 }

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