» Understanding the impact of gate-level physical reliability effects on whole program execution

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Raghuraman Balasubramanian and Karthikeyan Sankaralingam. Understanding the impact of gate-level physical reliability effects on whole program execution. In 20th IEEE International Symposium on High Performance Computer Architecture, HPCA 2014, Orlando, FL, USA, February 15-19, 2014, pp. 60-71, IEEE Computer Society, 2014.

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BibTeX

 @inproceedings{DBLP:conf/hpca/BalasubramanianS14,
   author    = {Raghuraman Balasubramanian and
                Karthikeyan Sankaralingam},
   title     = {Understanding the impact of gate-level physical reliability effects
                on whole program execution},
   booktitle = {20th {IEEE} International Symposium on High Performance Computer Architecture,
                {HPCA} 2014, Orlando, FL, USA, February 15-19, 2014},
   pages     = {60--71},
   publisher = {{IEEE} Computer Society},
   year      = {2014},
   url       = {https://doi.org/10.1109/HPCA.2014.6835976},
   doi       = {10.1109/HPCA.2014.6835976},
   timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
   biburl    = {https://dblp.org/rec/conf/hpca/BalasubramanianS14.bib},
   bibsource = {dblp computer science bibliography, https://dblp.org}
 }

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