» Time redundant parity for low-cost transient error detection

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David J. Palframan, Nam Sung Kim, and Mikko H. Lipasti. Time redundant parity for low-cost transient error detection. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011, pp. 52-57, IEEE, 2011.

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BibTeX

 @inproceedings{DBLP:conf/date/PalframanKL11,
   author    = {David J. Palframan and
                Nam Sung Kim and
                Mikko H. Lipasti},
   title     = {Time redundant parity for low-cost transient error detection},
   booktitle = {Design, Automation and Test in Europe, {DATE} 2011, Grenoble, France,
                March 14-18, 2011},
   pages     = {52--57},
   publisher = {{IEEE}},
   year      = {2011},
   url       = {https://doi.org/10.1109/DATE.2011.5763017},
   doi       = {10.1109/DATE.2011.5763017},
   timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
   biburl    = {https://dblp.org/rec/conf/date/PalframanKL11.bib},
   bibsource = {dblp computer science bibliography, https://dblp.org}
 }

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