Dec 15, 2017

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Comprehensive Circuit Failure Prediction and Detection for Logic and SRAM using Virtual Aging, Sampled Redundancy, and Asymmetric Checkers

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Amir Yazdanbakhsh, Raghuraman Balasubramanian, Tony Nowatzki, and Karthikeyan Sankaralingam. Comprehensive Circuit Failure Prediction and Detection for Logic and SRAM using Virtual Aging, Sampled Redundancy, and Asymmetric Checkers. IEEE Micro, 2015.

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BibTeX

 @article{ieeemicro15:sdmr,
   title={Comprehensive Circuit Failure Prediction and Detection for Logic and SRAM using Virtual Aging, Sampled Redundancy, and Asymmetric Checkers},
   author={Amir Yazdanbakhsh and Raghuraman Balasubramanian and Tony Nowatzki and Karthikeyan Sankaralingam},
   journal="{IEEE Micro}",
   year={2015},
   bib_pubtype = {Journal},
   bib_rescat = {Architecture}
 }

Generated by bib.pl (written by Patrick Riley ) on Sat Jul 15, 2017 14:53:22 time=1207019082

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